The Role of Frustration in Magnetism of Ge$\text{}_{1-x}$Cr$\text{}_{x}$Te Semimagnetic Semiconductor

We present preliminary studies of magnetic properties of Ge$\text{}_{1-x}$Cr$\text{}_{x}$Te semimagnetic semiconductors with low chromium content x < 0.026. The static and dynamic magnetometry techniques were employed for the current investigations. The obtained results showed large bifurcations between zero-field cooled and field cooled magnetization curves at temperatures lower than 50 K. The dynamic susceptibility measurements proved via frequency shifting of the peaks that the observed magnetic order at low temperatures was the spin-glass-like state caused by magnetic frustration of the system.